Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/20.500.11765/7476
Two simulated annealing optimization schemas for rational bézier curve fitting in the presence of noise
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dc.contributor.authorIglesias, Andréses_ES
dc.contributor.authorGálvez, Akemies_ES
dc.contributor.authorLoucera, Carloses_ES
dc.date.accessioned2017-08-17T07:08:34Z-
dc.date.available2017-08-17T07:08:34Z-
dc.date.issued2016-
dc.identifier.citationMathematical Problems in Engineering. 2016, p. 1-18es_ES
dc.identifier.issn1024-123X-
dc.identifier.issn1563-5147-
dc.identifier.urihttp://hdl.handle.net/20.500.11765/7476-
dc.description.abstractFitting curves to noisy data points is a difficult problem arising in many scientific and industrial domains. Although polynomial functions are usually applied to this task, there are many shapes that cannot be properly fitted by using this approach. In this paper, we tackle this issue by using rational Bézier curves. This is a very difficult problem that requires computing four different sets of unknowns (data parameters, poles, weights, and the curve degree) strongly related to each other in a highly nonlinear way. This leads to a difficult continuous nonlinear optimization problem. In this paper, we propose two simulated annealing schemas (the all-in-one schema and the sequential schema) to determine the data parameterization and the weights of the poles of the fitting curve. These schemas are combined with least-squares minimization and the Bayesian Information Criterion to calculate the poles and the optimal degree of the best fitting Bézier rational curve, respectively. We apply our methods to a benchmark of three carefully chosen examples of 2D and 3D noisy data points. Our experimental results show that this methodology (particularly, the sequential schema) outperforms previous polynomial-based approaches for our data fitting problem, even in the presence of noise of low-medium intensity.es_ES
dc.description.sponsorshipThis research has been kindly supported by the Computer Science National Program of the Spanish Ministry of Economy and Competitiveness, Project Ref. #TIN2012-30768, Toho University (Funabashi, Japan), and the University of Cantabria (Santander, Spain).es_ES
dc.language.isoenges_ES
dc.publisherHindawies_ES
dc.rightsLicencia CC: Reconocimiento CC BYes_ES
dc.subjectNoisy dataes_ES
dc.subjectBézier curvees_ES
dc.subjectSimulated annealing schemases_ES
dc.titleTwo simulated annealing optimization schemas for rational bézier curve fitting in the presence of noisees_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.relation.publisherversionhttp://dx.doi.org/10.1155/2016/8241275es_ES
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses_ES
Colecciones: Artículos científicos 2015-2018


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